Astronomy

PROCEEDINGS & JOURNAL ARTICLES

Journal of Astronomical Telescopes, Instruments, and Systems  |  Detector Systems and Sensor Technologies
June 28, 2017
J. Astron. Telesc. Instrum. Syst. 3 (3), 036001 (June 28, 2017);  doi:10.1117/1.JATIS.3.3.036001

Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 103292M (June 26, 2017);  doi:10.1117/12.2271782

Proceedings Volume 10330 (Modeling Aspects in Optical Metrology VI) >
June 26, 2017
Proc SPIE. 10330, Modeling Aspects in Optical Metrology VI, 103301D (June 26, 2017);  doi:10.1117/12.2270084

Proceedings Volume 10335 (Digital Optical Technologies 2017) >
June 26, 2017
Proc SPIE. 10335, Digital Optical Technologies 2017, 103351U (June 26, 2017);  doi:10.1117/12.2269741

Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 103294P (June 26, 2017);  doi:10.1117/12.2272512

Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 103290Y (June 26, 2017);  doi:10.1117/12.2271846

Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 103290Z (June 26, 2017);  doi:10.1117/12.2271953

Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 103291G (June 26, 2017);  doi:10.1117/12.2276582

Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 103292H (June 26, 2017);  doi:10.1117/12.2270254

Proceedings Volume 10235 (EUV and X-ray Optics: Synergy between Laboratory and Space V) >
June 21, 2017
Proc SPIE. 10235, EUV and X-ray Optics: Synergy between Laboratory and Space V, 1023507 (June 21, 2017);  doi:10.1117/12.2271816

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