Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878823 (May 13, 2013); doi:10.1117/12.2020407
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878907 (May 13, 2013); doi:10.1117/12.2019986
Journal of Electronic Imaging
|
Regular Articles
May 10, 2013
J. Electron. Imaging. 22 (2), 023010 (May 10, 2013); doi:10.1117/1.JEI.22.2.023010
Journal of Electronic Imaging
|
Regular Articles
May 10, 2013
J. Electron. Imaging. 22 (2), 023013 (May 10, 2013); doi:10.1117/1.JEI.22.2.023013
Proceedings Volume 8781 (Integrated Optics: Physics and Simulations) >
May 07, 2013
Proc SPIE. 8781, Integrated Optics: Physics and Simulations, 878117 (May 7, 2013); doi:10.1117/12.2017207
Optical Engineering
|
EDITORIAL
May 07, 2013
Opt. Eng. 52 (5), 050101 (May 07, 2013); doi:10.1117/1.OE.52.5.050101
Open Access
Journal of Applied Remote Sensing
|
Research Papers
May 07, 2013
J. Appl. Remote Sens. 7 (1), 073566 (May 07, 2013); doi:10.1117/1.JRS.7.073566
Proceedings Volume 8773 (Photon Counting Applications IV; and Quantum Optics and Quantum Information Transfer and Processing) >
May 06, 2013
Proc SPIE. 8773, Photon Counting Applications IV; and Quantum Optics and Quantum Information Transfer and Processing, 87730P (May 6, 2013); doi:10.1117/12.1518444
Proceedings Volume 8773 (Photon Counting Applications IV; and Quantum Optics and Quantum Information Transfer and Processing) >
May 06, 2013
Proc SPIE. 8773, Photon Counting Applications IV; and Quantum Optics and Quantum Information Transfer and Processing, 87730R (May 6, 2013); doi:10.1117/12.2017681
Proceedings Volume 8775 (Micro-structured and Specialty Optical Fibres II) >
May 03, 2013
Proc SPIE. 8775, Micro-structured and Specialty Optical Fibres II, 877503 (May 3, 2013); doi:10.1117/12.2020909
