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PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Low coherence full field interference microscopy or optical coherence tomography: recent advances, limitations and future trends
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878802 (May 13, 2013);  doi:10.1117/12.2025199
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Concept, realization and performance of a two-beam phase-shifting point diffraction interferometer
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878805 (May 13, 2013);  doi:10.1117/12.2020618
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Lensless single-exposure super-resolved interferometric microscopy
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878808 (May 13, 2013);  doi:10.1117/12.2020580
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Lensless object scanning holography for diffuse objects
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880D (May 13, 2013);  doi:10.1117/12.2020564
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Optical characterization method for very small microlenses (sub-50 micron) for industrial mass-production applications
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880G (May 13, 2013);  doi:10.1117/12.2020589
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
A computational tool to highlight anomalies on shearographic images in optical flaw detection
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880L (May 13, 2013);  doi:10.1117/12.2020978
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
ESPI based on spatial fringe analysis method using only two sheets of speckle patterns
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880M (May 13, 2013);  doi:10.1117/12.2019204
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
A polarization-based frequency shifting interferometry for inspecting transparent objects in microelectronics manufacturing
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880P (May 13, 2013);  doi:10.1117/12.2020736
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
High speed measurement of specular surfaces based on carrier fringe patterns in a line scan Michelson interferometer setup
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880R (May 13, 2013);  doi:10.1117/12.2020121
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Robust evaluation of intensity curves measured by confocal microscopies
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880T (May 13, 2013);  doi:10.1117/12.2020551

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