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PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 10454 (Photomask Japan 2017: XXIV Symposium on Photomask and Next-Generation Lithography Mask Technology) >
July 13, 2017
Proc SPIE. 10454, Photomask Japan 2017: XXIV Symposium on Photomask and Next-Generation Lithography Mask Technology, 1045402 (July 13, 2017);  doi:10.1117/12.2284332

Proceedings Volume 10454 (Photomask Japan 2017: XXIV Symposium on Photomask and Next-Generation Lithography Mask Technology) >
July 13, 2017
Proc SPIE. 10454, Photomask Japan 2017: XXIV Symposium on Photomask and Next-Generation Lithography Mask Technology, 1045404 (July 13, 2017);  doi:10.1117/12.2278689

Proceedings Volume 10324 (International Conference on Nano-Bio Sensing, Imaging, and Spectroscopy 2017) >
July 12, 2017
Proc SPIE. 10324, International Conference on Nano-Bio Sensing, Imaging, and Spectroscopy 2017, 1032402 (July 12, 2017);  doi:10.1117/12.2266495

Proceedings Volume 10324 (International Conference on Nano-Bio Sensing, Imaging, and Spectroscopy 2017) >
July 12, 2017
Proc SPIE. 10324, International Conference on Nano-Bio Sensing, Imaging, and Spectroscopy 2017, 1032404 (July 12, 2017);  doi:10.1117/12.2267206

Optical Engineering  |  Materials, Photonic Devices, and Sensors
July 12, 2017
Opt. Eng. 56 (7), 077105 (July 12, 2017);  doi:10.1117/1.OE.56.7.077105

Journal of Nanophotonics  |  Research Papers
July 06, 2017
J. Nanophoton. 11 (3), 036001 (July 06, 2017);  doi:10.1117/1.JNP.11.036001

Journal of Photonics for Energy  |  Advanced Concepts and Applications
June 29, 2017
J. Photon. Energy. 7 (2), 028003 (June 29, 2017);  doi:10.1117/1.JPE.7.028003

Journal of Biomedical Optics  |  Research Papers: General
June 28, 2017
J. Biomed. Opt. 22 (6), 065005 (June 28, 2017);  doi:10.1117/1.JBO.22.6.065005

Open Access Open Access


Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 1032930 (June 26, 2017);  doi:10.1117/12.2270247

Proceedings Volume 10329 (Optical Measurement Systems for Industrial Inspection X) >
June 26, 2017
Proc SPIE. 10329, Optical Measurement Systems for Industrial Inspection X, 103293F (June 26, 2017);  doi:10.1117/12.2269746

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