Metrology

PROCEEDINGS & JOURNAL ARTICLES

Journal of Applied Remote Sensing  |  Remote Sensing Applications and Decision Support
January 12, 2017
J. Appl. Remote Sens. 11 (1), 016008 (January 12, 2017);  doi:10.1117/1.JRS.11.016008

Open Access Open Access


Journal of Applied Remote Sensing  |  Remote Sensing Applications and Decision Support
January 12, 2017
J. Appl. Remote Sens. 11 (1), 016010 (January 12, 2017);  doi:10.1117/1.JRS.11.016010

Journal of Micro/Nanolithography, MEMS, and MOEMS  |  Lithography
January 12, 2017
J. Micro/Nanolith. MEMS MOEMS. 16 (1), 013501 (January 12, 2017);  doi:10.1117/1.JMM.16.1.013501

Optical Engineering  |  Instrumentation, Techniques, and Measurement
January 09, 2017
Opt. Eng. 56 (1), 014103 (January 09, 2017);  doi:10.1117/1.OE.56.1.014103

Journal of Applied Remote Sensing  |  Remote Sensing Applications and Decision Support
January 06, 2017
J. Appl. Remote Sens. 11 (1), 016003 (January 06, 2017);  doi:10.1117/1.JRS.11.016003

Open Access Open Access


Proceedings Volume 10244 (International Conference on Optoelectronics and Microelectronics Technology and Application) >
January 05, 2017
Proc SPIE. 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102440D (January 5, 2017);  doi:10.1117/12.2257472

Proceedings Volume 10244 (International Conference on Optoelectronics and Microelectronics Technology and Application) >
January 05, 2017
Proc SPIE. 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102440I (January 5, 2017);  doi:10.1117/12.2258392

Proceedings Volume 10244 (International Conference on Optoelectronics and Microelectronics Technology and Application) >
January 05, 2017
Proc SPIE. 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102440S (January 5, 2017);  doi:10.1117/12.2264236

Proceedings Volume 10244 (International Conference on Optoelectronics and Microelectronics Technology and Application) >
January 05, 2017
Proc SPIE. 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102441L (January 5, 2017);  doi:10.1117/12.2264227

Proceedings Volume 10244 (International Conference on Optoelectronics and Microelectronics Technology and Application) >
January 05, 2017
Proc SPIE. 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102441R (January 5, 2017);  doi:10.1117/12.2264883

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