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PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Low coherence full field interference microscopy or optical coherence tomography: recent advances, limitations and future trends
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878802 (May 13, 2013);  doi:10.1117/12.2025199
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Excess fraction measurement of a transparent glass thickness in wavelength tuning interferometry
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878803 (May 13, 2013);  doi:10.1117/12.2020327
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Metrology for adhesive layer of temporary bonding wafers using IR interferometry
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878804 (May 13, 2013);  doi:10.1117/12.2020437
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Sparsity-based denoising method of wrapped-phase reconstructions in digital holography
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878806 (May 13, 2013);  doi:10.1117/12.2020554
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Holographic Interferometry based on photorefractive crystal to measure 3D thermo-elastic distortion of composite structures and comparison with finite element models
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878807 (May 13, 2013);  doi:10.1117/12.2020542
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Lensless single-exposure super-resolved interferometric microscopy
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878808 (May 13, 2013);  doi:10.1117/12.2020580
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Resolution enhancement and autofocusing in digital holographic microscopy by using structured illumination
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878809 (May 13, 2013);  doi:10.1117/12.2020298
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Hybrid and transflective system based on digital holographic microscope and low coherent interferometer for high gradient shape measurement
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880A (May 13, 2013);  doi:10.1117/12.2020980
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Total compensation of chromatic errors in digital color holography using a single recording
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880B (May 13, 2013);  doi:10.1117/12.2022550
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Lensless object scanning holography for diffuse objects
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880D (May 13, 2013);  doi:10.1117/12.2020564
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