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PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Lensless single-exposure super-resolved interferometric microscopy
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878808 (May 13, 2013);  doi:10.1117/12.2020580
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Speed-up chromatic sensors by optimized optical filters
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880S (May 13, 2013);  doi:10.1117/12.2020387
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Model-based assistance system for confocal measurements of rough surfaces
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880U (May 13, 2013);  doi:10.1117/12.2019991
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Parallelized chromatic confocal sensor systems
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880V (May 13, 2013);  doi:10.1117/12.2020334
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Model-based, active inspection of three-dimensional objects using a multi-sensor measurement system
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880Y (May 13, 2013);  doi:10.1117/12.2020463
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Miniature low-cost extrinsic Fabry-Perot interferometer for low-pressure detection
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878811 (May 13, 2013);  doi:10.1117/12.2019799
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Methods to obtain the waveform profile from slope measurements
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881F (May 13, 2013);  doi:10.1117/12.2020534
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
3D shape measurements of fast moving rough surfaces by two tilted interference fringe systems
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881T (May 13, 2013);  doi:10.1117/12.2020168
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
A lateral sensor for the alignment of two formation-flying satellites
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878820 (May 13, 2013);  doi:10.1117/12.2020341
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Imaging sensor for monitoring of the piston mechanism in cylindrical valves
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878824 (May 13, 2013);  doi:10.1117/12.2020404

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