0
Sign In      Subscribe      Contact Us      Help  

Remote Sensing

Email Alert
Please Wait... Processing your request... Please Wait.

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Nanometrology of periodic nanopillar arrays by means of light scattering
PDFPDF
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881O (May 13, 2013);  doi:10.1117/12.2020880
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Phase information in coherent Fourier scatterometry
PDFPDF
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881P (May 13, 2013);  doi:10.1117/12.2020506
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Metrology solutions using optical scatterometry for advanced CMOS: III-V and Germanium multi-gate field-effect transistors
PDFPDF
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881R (May 13, 2013);  doi:10.1117/12.2020248
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Laser welding control by monitoring of plasma
PDFPDF
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882P (May 13, 2013);  doi:10.1117/12.2021864
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
Assessment of the scatterometry capability to detect an etch process deviation
PDFPDF
Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878902 (May 13, 2013);  doi:10.1117/12.2020486
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
Numerical investigations of the influence of different commonly applied approximations in scatterometry
PDFPDF
Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878904 (May 13, 2013);  doi:10.1117/12.2022108
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
Scatterometry sensitivity analysis for conical diffraction versus in-plane diffraction geometry with respect to the side wall angle
PDFPDF
Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878905 (May 13, 2013);  doi:10.1117/12.2020487
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
S-Genius, a universal software platform with versatile inverse problem resolution for scatterometry
PDFPDF
Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878919 (May 13, 2013);  doi:10.1117/12.2020674
Journal of Applied Remote Sensing  |  Research Papers
May 13, 2013
Detecting flooded areas with machine learning techniques: case study of the Selška Sora river flash flood in September 2007
PDFPDF
J. Appl. Remote Sens. 7 (1), 073564 (May 13, 2013);  doi:10.1117/1.JRS.7.073564

Open Access

Journal of Applied Remote Sensing  |  Research Papers
May 09, 2013
Modified average local variance for pixel-level scale selection of multiband remote sensing images and its scale effect on image classification accuracy
PDFPDF
J. Appl. Remote Sens. 7 (1), 073565 (May 09, 2013);  doi:10.1117/1.JRS.7.073565

BOOKS

Field Guide to Infrared Systems
PDF PDF
Field Guide to Infrared Systems
PDF PDF
Advertisement
SPIE © 1962 - 2013. All Rights Reserved.
Buy this article ($18 for members, $25 for non-members).
Sign In