Optoelectronic Techniques For Measurement And Inspection

Lionel R. Baker

doi:10.1117/12.936906

28 October 1987 Optoelectronic Techniques For Measurement And Inspection

Lionel R. Baker

Proceedings Volume 0699, Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review; (1987) https://doi.org/10.1117/12.936906
Event: Laser and Opto-Electronic Technology in Industry: State of the Art Review, 1986, Xiamen, China

Abstract

The advantages of using optoelectronic techniques and the problems which need to be overcome when applying them in the field of measurement and inspection are reviewed. After a brief description of the basic methods and principles employed, typical systems recently developed at Sira using lasers, white light and infrared radiation for the inspection of large areas, microscopic defects and stress patterns are described to illustrate the range of new methods now available for use by industry.

Citation Download Citation

Lionel R. Baker "Optoelectronic Techniques For Measurement And Inspection", Proc. SPIE 0699, Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review, (28 October 1987); https://doi.org/10.1117/12.936906

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