Paper
28 September 2016 RIN measurements of the 850nm VCSELs
Łukasz Chorchos, Jarosław P. Turkiewicz
Author Affiliations +
Proceedings Volume 10031, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016; 100311E (2016) https://doi.org/10.1117/12.2249366
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016, 2016, Wilga, Poland
Abstract
In this paper, the relative intensity noise (RIN) measurements studies of multimode 850nm vertical cavity surface emitting lasers are presented. The used method is based on the RF spectrum measurement of a biased and unmodulated laser. Further a method based on the oscilloscope measurements is applied. The results obtained for both methods are comparable and differ less than 2 dB. The obtained RINs were in the range from -143.87 to -139.45 dB/Hz for various VCSEL biases.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Łukasz Chorchos and Jarosław P. Turkiewicz "RIN measurements of the 850nm VCSELs", Proc. SPIE 10031, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016, 100311E (28 September 2016); https://doi.org/10.1117/12.2249366
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KEYWORDS
Vertical cavity surface emitting lasers

Spectrum analysis

Amplifiers

Signal to noise ratio

Oscilloscopes

Photodiodes

Interference (communication)

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