Single-shot beam profile diagnostics for x-ray FEL's using gas fluorescence

Yiping Feng; Diling Zhu; Clemens Weninger; Roberto Alonso-Mori; Matthieu Chollet; Daniel S. Damiani; James M. Glownia; Jerome B. Hastings; Silke Nelson; Sanghoon Song; Aymeric Robert

doi:10.1117/12.2268862

14 June 2017 Single-shot beam profile diagnostics for x-ray FEL's using gas fluorescence

Yiping Feng, Diling Zhu, Clemens Weninger, Roberto Alonso-Mori, Matthieu Chollet, Daniel S. Damiani, James M. Glownia, Jerome B. Hastings, Silke Nelson, Sanghoon Song, Aymeric Robert

Author Affiliations +

Proceedings Volume 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV; 102370M (2017) https://doi.org/10.1117/12.2268862
Event: SPIE Optics + Optoelectronics, 2017, Prague, Czech Republic

Abstract

We report experimental demonstration of capturing single-shot X-ray Free-electron Laser (FEL) beam profiles using gas fluorescence. The measurement was carried out at the Linac Coherent Light Source using 7 keV hard X-rays propagating through ambient air. The nitrogen fluorescence emitted upon the passage of the X-ray FEL beam were imaged using a highly sensitive optical setup, and there was sufficient optical yield that single-shot measurements were feasible. By taking two orthogonal and simultaneous images, the beam trajectory could be determined in a nearly non-invasive manner, and is best suited for photon energies in the soft X-ray regime, where such a diagnostic capability has been largely unavailable previously. The integrated intensity of the images could also serve as a non-invasive intensity monitor, complementary to current implementations of gas- and solidbased monitors. High repetition-rate Free-electron Lasers can greatly benefit from such a new diagnostic tool for eliminating potential thermal damages.

Conference Presentation

Citation Download Citation

Yiping Feng, Diling Zhu, Clemens Weninger, Roberto Alonso-Mori, Matthieu Chollet, Daniel S. Damiani, James M. Glownia, Jerome B. Hastings, Silke Nelson, Sanghoon Song, and Aymeric Robert "Single-shot beam profile diagnostics for x-ray FEL's using gas fluorescence", Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 102370M (14 June 2017); https://doi.org/10.1117/12.2268862

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