Paper
28 February 2017 Research on spot of CCD subdivided locating methods in laser triangulation displacement measurement
Hongjun Wang, Lei Hui, Jiaying Zhang
Author Affiliations +
Proceedings Volume 10256, Second International Conference on Photonics and Optical Engineering; 102562U (2017) https://doi.org/10.1117/12.2257635
Event: Second International Conference on Photonics and Optical Engineering, 2016, Xi'an, China
Abstract
In order to improve the measurement accuracy of the laser displacement sensor, the laser triangulation displacement measuring system is established. The spot subdivision location algorithms of the system are studied, such as the Gaussian curve fitting, traditional gray weighted centroid and gray square weighted centroid. First, according to the principle of laser triangulation, the displacement measuring system is built. Then, objects are moved by the high-precision motorized stage, obtaining multiple sets of image data. Next, these data respectively are processed by the above several algorithms to obtain the corresponding coordinates of the laser spot, the system is calibrated respectively. Finally, comparing the displacement of calibration results calculating with the actual displacement. The results show that: those data that are processed by the gray square weighted centroid are used to calibrate , calculating the minimum error, and is 71.1 μm. It concludes that gray square weighted centroid is an ideal location segmentation method, which is not only simple and easy to implement, but also has a higher positioning accuracy.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongjun Wang, Lei Hui, and Jiaying Zhang "Research on spot of CCD subdivided locating methods in laser triangulation displacement measurement", Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102562U (28 February 2017); https://doi.org/10.1117/12.2257635
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KEYWORDS
Calibration

Charge-coupled devices

Data processing

Laser systems engineering

CCD image sensors

Optical testing

Sensors

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