Measurement and characterization of IR thin film bandpass filters

Donald L. Stierwalt

doi:10.1117/12.58694

1 January 1992 Measurement and characterization of IR thin film bandpass filters

Donald L. Stierwalt

Proceedings Volume 10261, Infrared Thin Films: A Critical Review; 102610A (1992) https://doi.org/10.1117/12.58694
Event: Critical Reviews, 1991, San Jose, CA, United States

Abstract

The performance of thin film interference bandpass filters is affected by several external parameters. The filters must therefore be characterized under simulated operating conditions. Some of the problems encountered and solutions to these problems are discussed.

Citation Download Citation

Donald L. Stierwalt "Measurement and characterization of IR thin film bandpass filters", Proc. SPIE 10261, Infrared Thin Films: A Critical Review, 102610A (1 January 1992); https://doi.org/10.1117/12.58694

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available