CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 10748 > Article
Paper
19 September 2018 Implications of new stringent requirements for contamination control
John R. Anderson, Ned Ferraro, Carlos Soares
Author Affiliations +
Proceedings Volume 10748, Systems Contamination: Prediction, Control, and Performance 2018; 107480D (2018) https://doi.org/10.1117/12.2325982
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States
Abstract
The field of contamination control has evolved to deal with increasingly sophisticated instruments developed in response to increasingly complex missions. Although there have been failures and degraded instrument performance due to contamination, contamination control methods have been largely successful to date. However, due to improvements in technology and the desire for more sensitive science measurements, spacecraft are no longer clean enough to meet more stringent contamination requirements. New contamination control engineering methods will require institutional investments. As a first step toward identifying appropriate areas for these investments, a “brainstorming” exercise is performed addressing some of the more important areas where improvements are needed.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
John R. Anderson, Ned Ferraro, and Carlos Soares "Implications of new stringent requirements for contamination control", Proc. SPIE 10748, Systems Contamination: Prediction, Control, and Performance 2018, 107480D (19 September 2018); https://doi.org/10.1117/12.2325982
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 4 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Additive manufacturing
Adhesives
Control systems
Data modeling
Dielectrics
Manufacturing
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top