Pseudo-CCD-signal-based signal-to-noise test system for readout chain of TDICCD

Gengyun Wang; Hongbo Bu; Liqun Dai; Xu Zhang; Songbo Wu; Qiyang Sun

doi:10.1117/12.2500826

23 October 2018 Pseudo-CCD-signal-based signal-to-noise test system for readout chain of TDICCD

Gengyun Wang, Hongbo Bu, Liqun Dai, Xu Zhang, Songbo Wu, Qiyang Sun

Proceedings Volume 10821, Advanced Sensor Systems and Applications VIII; 108210S (2018) https://doi.org/10.1117/12.2500826
Event: SPIE/COS Photonics Asia, 2018, Beijing, China

Abstract

The readout chain circuits for time delay integration charge coupled device camera imaging system include CCD focal plane driving circuit, analog-to-digital conversion circuit, high-speed digital data transmission circuit and other parts together. The parasitic factors such as the quality of high frequency clock, high speed data transmission error rate and the aging of printed circuit board will induce more noise to image data of camera. As the longer time circuits working, the noise of readout chain becomes bigger and bigger, then the signal-to-noise becomes worse. This paper proposed a method to make circuit system check its noise as the circuit is working, which is based on pseudo CCD-signal to check the Signal-to-Noise of readout chain of TDICCD, and sends the result to control core of the system. The paper combines the theory calculation and actual measurement as the method for testing. High precision pseudo CCD signal source is used to test the onboard circuit and circuit SNR results of readout chain, harmonic frequency, noise floor and other related parameters are automatic processed.

Citation Download Citation

Gengyun Wang, Hongbo Bu, Liqun Dai, Xu Zhang, Songbo Wu, and Qiyang Sun "Pseudo-CCD-signal-based signal-to-noise test system for readout chain of TDICCD", Proc. SPIE 10821, Advanced Sensor Systems and Applications VIII, 108210S (23 October 2018); https://doi.org/10.1117/12.2500826

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