Polarization characteristics of full-field and full-pupil in refraction and reflection telephoto system

Jiayu Wang; Yingchao Li; Haodong Shi

doi:10.1117/12.2511419

7 November 2018 Polarization characteristics of full-field and full-pupil in refraction and reflection telephoto system

Jiayu Wang, Yingchao Li, Haodong Shi

Proceedings Volume 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications; 108321C (2018) https://doi.org/10.1117/12.2511419
Event: Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 2018, Changchun, China

Abstract

In order to solve the evaluation problem of optical system under partially polarized light conditions caused by single ray tracing method, a full-field and full-pupil ray tracing method based on Stokes is proposed. The analytical relationship among the degrees of polarization (DOP) of the incident ray, the angle of the ray and the DOP of the emitting light is analyzed. The analysis results show that when the difference value between the incident angle and the refracted angle is less than 5.7°, the influence of the system on the DOP of the light can be reduced effectively. According to the space target polarization imaging requirements, a polarization imaging optical system with micro-polarizer array detector is designed. The resolution is 0.5m at the distance of 500km. Dynamic data exchange (DDE) is used to trace the full-field and full-pupil rays for the optimized optical system. Due to the DOP of any field of view can be calibrated, the polarization detecting accuracy of the optical system is improved. Therefore, the target can be recognized by matching the DOP of the incident ray and the DOP of any field of view.

Citation Download Citation

Jiayu Wang, Yingchao Li, and Haodong Shi "Polarization characteristics of full-field and full-pupil in refraction and reflection telephoto system", Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 108321C (7 November 2018); https://doi.org/10.1117/12.2511419

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Polarization

Ray tracing

Refraction

Calibration

Satellites

Aerospace engineering

Imaging systems

Show All Keywords

Keywords/Phrases

Search In:

Publication Years