Negative differential capacitance in InGaAs/InAlAs photodetector

Junxi Zhang; Jun Chen

doi:10.1117/12.2505396

12 December 2018 Negative differential capacitance in InGaAs/InAlAs photodetector

Junxi Zhang, Jun Chen

Proceedings Volume 10846, Optical Sensing and Imaging Technologies and Applications; 1084627 (2018) https://doi.org/10.1117/12.2505396
Event: International Symposium on Optoelectronic Technology and Application 2018, 2018, Beijing, China

Abstract

Negative differential capacitance (NDC) has been observed in InGaAs/InAlAs p-i-n photodetector. The frequency dependence of the NDC is observed at the frequency of 50~300kHz. A model involving two states is built to explain the observed NDC behavior. Low dark current is obtained at room temperature with the 1550nm wavelength infrared light.

Citation Download Citation

Junxi Zhang and Jun Chen "Negative differential capacitance in InGaAs/InAlAs photodetector", Proc. SPIE 10846, Optical Sensing and Imaging Technologies and Applications, 1084627 (12 December 2018); https://doi.org/10.1117/12.2505396

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available