Paper
15 November 2018 Influence of the evanescent waves on the imaging characteristics of microspheres
Author Affiliations +
Proceedings Volume 10964, Tenth International Conference on Information Optics and Photonics; 109643H (2018) https://doi.org/10.1117/12.2505948
Event: Tenth International Conference on Information Optics and Photonics (CIOP 2018), 2018, Beijing, China
Abstract
We add a 20-nm-thick SiO film between a fully immersed BaTiO3 glass (BTG) microsphere and a sample with subdiffraction features, and study its imaging properties. Compared with a fully immersed BTG microsphere without the SiO film, the magnification becomes larger, and the initial image position is farther away from the sample. The imaging rules no longer satisfy the imaging rules used in geometrical optics. We propose that the thin SiO film can enhance evanescent waves and the enhanced evanescent waves affect the magnification and the image position in BTG microsphere imaging. Our studies will help to understand the imaging rules of microspheres more comprehensively.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fengge Wang, Yurong Cao, Songlin Yang, Xiaoqing Wang, Jianguo Wang, Tao Chen, and Yong-Hong Ye "Influence of the evanescent waves on the imaging characteristics of microspheres", Proc. SPIE 10964, Tenth International Conference on Information Optics and Photonics, 109643H (15 November 2018); https://doi.org/10.1117/12.2505948
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KEYWORDS
Dielectrics

Silica

Scanning electron microscopy

Geometrical optics

Imaging arrays

Super resolution

Thin films

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