Study on multiphase diffusion reaction for interface of magnesium particle in microscale

Xiao Xie; ChenGuang Zhu; JingRan Xu; ChenGuang Yan

doi:10.1117/12.2522160

10 May 2019 Study on multiphase diffusion reaction for interface of magnesium particle in microscale

Xiao Xie, ChenGuang Zhu, JingRan Xu, ChenGuang Yan

Proceedings Volume 11068, Second Symposium on Novel Technology of X-Ray Imaging; 1106802 (2019) https://doi.org/10.1117/12.2522160
Event: Second Symposium on Novel Technology of X-Ray Imaging, 2018, Hefei, China

Abstract

Combustion mechanism of magnesium has long been explored. It has been recently shown that spherical magnesium particles with highly active can be used to analyze combustion process in detail with the help of new methods and advanced instruments. This work is aimed at investigating the multiple diffusion reaction of single spherical magnesium particles in accordance with surface composition and combustion remains. Energy Dispersive Spectrometer (EDS), Scanning Electron Microscope (SEM) and X-ray Diffraction (XRD) were used to analyze the samples before and after reaction. In addition, combustion of magnesium particle was conducted in a microscope heating system. The results of the study show that an oxygen-rich layer formed on the particle surface before the particle was heated to burn. Dissolved oxygen was detected in this layer and its concentration is lower than that of stoichiometric MgO. The dissolution reaction of oxygen begins before the gas phase combustion and later on, after the gas phase combustion stops, becomes the dominated reaction. It is suggested that there are two sources of MgO formed during the oxidation process, Mg(s) → Mg(g) → MgO(s) and Mg(s) → oxygen-rich layer(s) → MgO(s). The latter is the dominated mechanism of surface heterogeneous reaction.

Citation Download Citation

Xiao Xie, ChenGuang Zhu, JingRan Xu, and ChenGuang Yan "Study on multiphase diffusion reaction for interface of magnesium particle in microscale", Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 1106802 (10 May 2019); https://doi.org/10.1117/12.2522160

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