Presentation
10 September 2019 Probing carrier dynamics with THz time-domain and emission microscopy (Conference Presentation)
Author Affiliations +
Abstract
Terahertz (THz) time-domain spectroscopy and optical pump-THz probe spectroscopy are today widely used within the THz community to study material properties and carrier dynamics in semiconductors and 2D materials. Along with these methods, Laser THz Emission Microscopy (LTEM) is an alternative and somewhat simpler technique where THz pulses are collected from a sample after it is directly photo-excited by a femtosecond (fs) laser. Since most semiconductors intrinsically are able to emit THz pulses when carriers are accelerated on a fs time scale, this method is directly able to provide information about carrier mobility. At the same time, LTEM can image a sample with a much higher spatial resolution than conventional THz systems due to the much lower diffraction-limit of the fs laser pulses. Recently, it has been demonstrated that spintronic THz emitters have the potential of out-competing conventional THz sources showing an impressive efficiency and a bandwidth up to 10s of THz, which is normally only achieved in much more sophisticated THz sources such as air-plasmas generated with amplified fs laser systems. While some work has already been done in optimizing the spintronic structures to generate maximum THz signal and bandwidth, understanding the carrier dynamics from the measured THz pulses is still a challenge. In this presentation we discuss the ability to understand the carrier dynamics spintronic samples with LTEM and THz time-domain spectroscopy, and present an experimental platform where samples can be studied with these methods simultaneously.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pernille Klarskov "Probing carrier dynamics with THz time-domain and emission microscopy (Conference Presentation)", Proc. SPIE 11090, Spintronics XII, 1109012 (10 September 2019); https://doi.org/10.1117/12.2529938
Advertisement
Advertisement
KEYWORDS
Terahertz radiation

Carrier dynamics

Microscopy

Femtosecond phenomena

Spectroscopy

Spintronics

Optical spectroscopy

Back to Top