Correlative conventional scanning and ptychographic soft x-ray microscopy

Jiangtao Zhao; Kasra Nowrouzi; Richard Celestre; Matthew Marcus; Young-Sang Yu; David A. Shapiro

doi:10.1117/12.2531177

9 September 2019 Correlative conventional scanning and ptychographic soft x-ray microscopy

Jiangtao Zhao, Kasra Nowrouzi, Richard Celestre, Matthew Marcus, Young-Sang Yu, David A. Shapiro

Proceedings Volume 11112, X-Ray Nanoimaging: Instruments and Methods IV; 111120C (2019) https://doi.org/10.1117/12.2531177
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

Recent plans for x-ray synchrotrons to upgrade to new high brightness lattices have created great excitement about the potential for coherent x-ray imaging to provide a view of nano-materials with high spatial and temporal resolution. However, with increased x-ray brightness comes the inherent risk of radiation damage and the limited speed of current experimental systems. The Advanced Light Source has an extensive program in coherent scanning transmission x-ray microscopy (STXM) and ptychographic imaging with four beamlines covering an energy range of 200 to 2500 eV. Current instrument development efforts are focused on high-dynamic scanning for increased speed and the use of fast x-ray pixel detectors for high resolution ptychographic imaging. Our new microscope, called Nanosurveyor2, can scan at rates of up to 1 mm per second and has achieved a resolution of 3 times the x-ray wavelength. Using this system, we are developing novel scan trajectories and low dose imaging methods which combine high speed conventional STXM imaging with high resolution ptychography. Principal component analysis is used to extract high statistics spectra from noisy and low-resolution STXM data which are then used to _t a small number of ptychographic images for high spatial resolution chemical mapping with relatively low dose. We consider applications in the energy sciences where x-ray exposure has been observed to reduce the oxidation state of relevant compounds.

Citation Download Citation

Jiangtao Zhao, Kasra Nowrouzi, Richard Celestre, Matthew Marcus, Young-Sang Yu, and David A. Shapiro "Correlative conventional scanning and ptychographic soft x-ray microscopy", Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120C (9 September 2019); https://doi.org/10.1117/12.2531177

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KEYWORDS

X-rays

X-ray imaging

X-ray microscopy

Image resolution

Chemical analysis

Diffraction

Spatial resolution

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