Threshold wavelength extension with dark current reduction in infrared detectors

A. G. Unil Perera; Hemendra Ghimire

doi:10.1117/12.2531639

9 September 2019 Threshold wavelength extension with dark current reduction in infrared detectors

A. G. Unil Perera, Hemendra Ghimire

Proceedings Volume 11128, Infrared Remote Sensing and Instrumentation XXVII; 1112809 (2019) https://doi.org/10.1117/12.2531639
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The standard threshold wavelength (λ_t) of an Infrared (IR) detector is related to the energy gap Δ is given by Δ = 1.24/λ_t . Here, we summarize the results of a new class of IR detectors, that display threshold wavelengths (λ_t ^eff) (< λ_t) for the same corresponding Δ designed for λ_t . The extended threshold (ET) wavelength detectors includes epi-layers of barrieremitter-barrier, which are sandwiched in between the two contact regions. Spectral response of the device structures with different energy offsets between the barriers shows the wavelength extension, while the standard λ_t is observed without this offset (δ𝐸). The ET wavelength phenomena coupled with a reduced dark current corresponding to the designed Δ could provide a specific detectivity (D*) advantage over conventional detectors. A possible explanation of the results which include the role of potential barrier gradient for the performance of detectors will also be discussed.

Conference Presentation

Citation Download Citation

A. G. Unil Perera and Hemendra Ghimire "Threshold wavelength extension with dark current reduction in infrared detectors", Proc. SPIE 11128, Infrared Remote Sensing and Instrumentation XXVII, 1112809 (9 September 2019); https://doi.org/10.1117/12.2531639

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