Evaluation of a combined two-color phase plate forming three-dimensional dark holes in super resolution microscopy

Koumei Nagai; Takashi Maruyama; Akira Kodaira; Hiroshi Kumagai; Nándor Bokor; Yoshinori Iketaki

doi:10.1117/12.2545877

17 February 2020 Evaluation of a combined two-color phase plate forming three-dimensional dark holes in super resolution microscopy

Koumei Nagai, Takashi Maruyama, Akira Kodaira, Hiroshi Kumagai, Nándor Bokor, Yoshinori Iketaki

Author Affiliations +

Proceedings Volume 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII; 1124518 (2020) https://doi.org/10.1117/12.2545877
Event: SPIE BiOS, 2020, San Francisco, California, United States

Abstract

In this study, a combined two-color phase plate (CTPP) was designed for super-resolution microscopy based on upconversion fluorescence depletion (FD), fabricated, and evaluated. It is composed of two types of phase plates, a spiral phase plate and an annular phase plate. A two-color phase plate modulates the phase of the erase beam while maintaining the phase of the pump beam. SRM performed using the proposed CTPP is expected to enable super resolution in both the focal plane and in the optical axis direction. Despite its complex structure, a highly accurate CTPP was obtained by using the exposure and etching processes used in semiconductor manufacturing.

Citation Download Citation

Koumei Nagai, Takashi Maruyama, Akira Kodaira, Hiroshi Kumagai, Nándor Bokor, and Yoshinori Iketaki "Evaluation of a combined two-color phase plate forming three-dimensional dark holes in super resolution microscopy", Proc. SPIE 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII, 1124518 (17 February 2020); https://doi.org/10.1117/12.2545877

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