Silicon photonic phase interrogators for on-chip calibration of optical phased arrays

Jon Øyvind Kjellman; Mathias Prost; Aleksandrs Marinins; Hemant Kumar Tyagi; Tangla David Kongnyuy; Sarp Kerman; Benedetto Troia; Bruno Figeys; Sarvagya Dwivedi; Marcus S. Dahlem; Philippe Soussan; Xavier Rottenberg; Roelof Jansen

doi:10.1117/12.2546542

25 February 2020 Silicon photonic phase interrogators for on-chip calibration of optical phased arrays

Jon Øyvind Kjellman, Mathias Prost, Aleksandrs Marinins, Hemant Kumar Tyagi, Tangla David Kongnyuy, Sarp Kerman, Benedetto Troia, Bruno Figeys, Sarvagya Dwivedi, Marcus S. Dahlem, Philippe Soussan, Xavier Rottenberg, Roelof Jansen

Author Affiliations +

Proceedings Volume 11283, Integrated Optics: Devices, Materials, and Technologies XXIV; 112830X (2020) https://doi.org/10.1117/12.2546542
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

Correcting phase errors is key to building low cost, high performance integrated optical phased arrays for mass-market applications such as automotive lidar. In this work, we present a phase interrogator component for optical phased arrays which enables the phase error to be measured immediately before the output array of optical emitters. A 32-element silicon/silicon nitride optical phased array is realized in a dual layer photonics stack to verify the component performance. Silicon enables high density integration of photonic components and the phase interrogator has a compact design which fits between waveguides with a separation of 2.5 μm. The phase interrogators enable correction of the beam without any measurement or evaluation of the far-field.

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Jon Øyvind Kjellman, Mathias Prost, Aleksandrs Marinins, Hemant Kumar Tyagi, Tangla David Kongnyuy, Sarp Kerman, Benedetto Troia, Bruno Figeys, Sarvagya Dwivedi, Marcus S. Dahlem, Philippe Soussan, Xavier Rottenberg, and Roelof Jansen "Silicon photonic phase interrogators for on-chip calibration of optical phased arrays", Proc. SPIE 11283, Integrated Optics: Devices, Materials, and Technologies XXIV, 112830X (25 February 2020); https://doi.org/10.1117/12.2546542

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