Paper
6 February 2020 High-precision interference measurements of phase shift between orthogonal linear polarized beams at total internal reflection
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Proceedings Volume 11369, Fourteenth International Conference on Correlation Optics; 113690K (2020) https://doi.org/10.1117/12.2553965
Event: Fourteenth International Conference on Correlation Optics, 2019, Chernivtsi, Ukraine
Abstract
An interference method for measuring relative phase shift between orthogonally linearly polarized beams at total internal reflection with accuracy of 0.6 rad was proposed at this paper. We experimentally showed that it is impossible to determine the relative longitudinal displacement between beams with orthogonal linear polarizations at total internal reflection by the phase difference in the interferometer. The method developed by us could be useful in measurement of the reflected beam phase, to control the surface homogeneity, and to measure the refraction index of the prism.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. V. Angelsky, A. Ya. Bekshaev, E. I. Kurek, A. P. Maksimyak, P. P. Maksimyak, and Wenjun Yan "High-precision interference measurements of phase shift between orthogonal linear polarized beams at total internal reflection", Proc. SPIE 11369, Fourteenth International Conference on Correlation Optics, 113690K (6 February 2020); https://doi.org/10.1117/12.2553965
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KEYWORDS
Phase shifts

Polarization

Prisms

Reflection

Phase measurement

Calibration

Interferometers

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