A distributed common test platform environment

Wei Yan; Leili Hu; Shuizhong Chen; Shiyong Guo; Baolin Du; Hui Gan

doi:10.1117/12.2552470

31 January 2020 A distributed common test platform environment

Wei Yan, Leili Hu, Shuizhong Chen, Shiyong Guo, Baolin Du, Hui Gan

Proceedings Volume 11427, Second Target Recognition and Artificial Intelligence Summit Forum; 114272O (2020) https://doi.org/10.1117/12.2552470
Event: Second Target Recognition and Artificial Intelligence Summit Forum, 2019, Changchun, China

Abstract

In order to solve the inconvenience caused by the difference of hardware and software test resources during product testing, realize instrument interchange, meet the rapid change characteristics of test demand and rapid deployment requirements, this paper studies the construction method of a distributed test environment, adopts a fixed general test platform in hardware, and drives Heterogeneous hardware interface standardization technology (middleware technology), isolation module differences, to solve the different manufacturers to the module replacement to bring compatibility problems. Software adopts the design principle of layered software, connecting test elements such as device libraries, ICD libraries, use case libraries, etc. through the use case design layer, resource allocation layer, and hardware environment layer, and through XML between elements Exchange data information, interact with database information via Ethernet, and complete the automatic testing process. Each software runs independently on multiple test devices in the test environment, enabling the automatic execution of corresponding actions or automatically generating the test case software code through XML file.

Citation Download Citation

Wei Yan, Leili Hu, Shuizhong Chen, Shiyong Guo, Baolin Du, and Hui Gan "A distributed common test platform environment", Proc. SPIE 11427, Second Target Recognition and Artificial Intelligence Summit Forum, 114272O (31 January 2020); https://doi.org/10.1117/12.2552470

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available