CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11450 > Article
Paper
13 December 2020 The industrialization of astronomical instrumentation: an industrial system and process engineering perspective
Christopher Brandon, Richard W. Pogge, Mark A. Derwent, Thomas P. O'Brien, Colby A. Jurgenson, Daniel Pappalardo, Michael Engelman, Julia Brady, Jon Shover, Jerry Mason, Jean-Paul Kneib, Ricardo Araújo, Mohamed Bouri, Luzius Kronig, Loïc Grossen, Sarah E. Tuttle, Emily Farr
Author Affiliations +
Proceedings Volume 11450, Modeling, Systems Engineering, and Project Management for Astronomy IX; 1145022 (2020) https://doi.org/10.1117/12.2562964
Event: SPIE Astronomical Telescopes + Instrumentation, 2020, Online Only
Abstract
The Sloan Digital Sky Survey V (SDSS-V) is an all-sky spectroscopic survey of < 6 million objects, designed to decode the history of the Milky Way, reveal the inner workings of stars, investigate the origin of solar systems, and track the growth of supermassive black holes across the Universe. Collaboratively, organizations across both academia and industry have partnered to overcome technical challenges and execute operational directives associated with commissioning the various mechanical, electrical, and software subsystems of SDSS-V. While this type of collaboration is not unique, the scale and complexity of next generation astronomical instruments is an emerging challenge that requires industrial systems and process engineering practices at a quasi-industrial scale. Driven by the success of multiplexed spectroscopic surveys, instrumentation is evolving to include systems with hundreds to thousands of components and sub-assemblies procured or produced from various sources. This trend requires the adoption of new and existing processes and best practices in the design, integration, and test of next generation astronomical instruments. The following discussion outlines those industrial systems and process engineering processes, methods, and practices, currently in the operational phase, for the design, integration, and test of the SDSS-V Focal Plane System (FPS). An emphasis is placed on processes, methods, and practices related to coordination of multiple contract manufacturing vendors and operational execution of small batch manufacturing.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Christopher Brandon, Richard W. Pogge, Mark A. Derwent, Thomas P. O'Brien, Colby A. Jurgenson, Daniel Pappalardo, Michael Engelman, Julia Brady, Jon Shover, Jerry Mason, Jean-Paul Kneib, Ricardo Araújo, Mohamed Bouri, Luzius Kronig, Loïc Grossen, Sarah E. Tuttle, and Emily Farr "The industrialization of astronomical instrumentation: an industrial system and process engineering perspective", Proc. SPIE 11450, Modeling, Systems Engineering, and Project Management for Astronomy IX, 1145022 (13 December 2020); https://doi.org/10.1117/12.2562964
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 9 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Systems engineering
Astronomical instrumentation
Spectroscopes
Astronomy
Multiplexing
Solar system
Stars
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top