Characterization of the lacquerware from the Palace Museum by THz reflectometric imaging

Hongfei Zhang; Yuanmeng Zhao; Chengyu Li; Cunlin Zhang

doi:10.1117/12.2575959

5 November 2020 Characterization of the lacquerware from the Palace Museum by THz reflectometric imaging

Hongfei Zhang, Yuanmeng Zhao, Chengyu Li, Cunlin Zhang

Proceedings Volume 11562, AOPC 2020: Advanced Laser Technology and Application; 115620E (2020) https://doi.org/10.1117/12.2575959
Event: Applied Optics and Photonics China (AOPC 2020), 2020, Beijing, China

Abstract

Chinese traditional lacquerwares, ornamental objects decorated by multiple, composite layers of lacquers, are one of the most significant expressions of China art. Existing X-ray radiography and other detection technologies will cause irreparable damage to the lacquerware due to their high photon energy. Terahertz time-domain spectroscopic reflectometric imaging (THz-TDSRI) system being capable of highlight interfaces between layers in a stratigraphic buildup, could be a complementary technique for obtaining structural information about lacquered objects. In this study a Chinese lacquerware has been investigated by terahertz (THz) reflectometric imaging. The investigated lacquerware belongs to Palace Museum. The lacquerware is a decorative work made of a wood panel covered with several layers of lacquers to depict motifs. In order to detect lacquerware, the THz-TDSRI system was built by us. For imaging applications, the source of contrast is the optical density of materials and in reflection geometry the back-reflected THz pulse is analyzed for reflections originating from the various interfaces present between the various sample layers. The value of the electric field measured for each spatial coordinate (X, Y) of the scanned areas has been used for the bidimensional visualization of the lacquerware. The displaying method used in THz imaging application is pseudo coloring. Utilizing THz-TDSRI system, we observe non-invasively buried layers of the lacquerware, including faults in the wood layer, with the lacquerware was not injured. This shows that THz time-domain spectroscopic reflectometric imaging is a non-destructive inspection method for lacquer ware and has great potential in the future.

Citation Download Citation

Hongfei Zhang, Yuanmeng Zhao, Chengyu Li, and Cunlin Zhang "Characterization of the lacquerware from the Palace Museum by THz reflectometric imaging", Proc. SPIE 11562, AOPC 2020: Advanced Laser Technology and Application, 115620E (5 November 2020); https://doi.org/10.1117/12.2575959

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KEYWORDS

Terahertz radiation

Imaging systems

Reflection

Reflectance spectroscopy

Interfaces

Visualization

Resistance

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