Absolute Reflectance Measurements Of Metallic Surfaces In The 0.8-5.5Âµm Region

D. Sheffer; U. P. Oppenheim; A. D. Devir

doi:10.1117/12.978579

8 January 1990 Absolute Reflectance Measurements Of Metallic Surfaces In The 0.8-5.5 µm Region

D. Sheffer, U. P. Oppenheim, A. D. Devir

Proceedings Volume 1157, Infrared Technology XV; (1990) https://doi.org/10.1117/12.978579
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

An absolute reflectometer for the 0.8 - 5.5 microns region is described, and reflectance spectra for some diffuse metallic surfaces are given. Some of the spectra show a dip of 5-7% in the reflectance values of the surfaces in the 3.0 - 3.5 microns region. Possible causes for the observed dips are discussed.

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D. Sheffer, U. P. Oppenheim, and A. D. Devir "Absolute Reflectance Measurements Of Metallic Surfaces In The 0.8-5.5 µm Region", Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); https://doi.org/10.1117/12.978579

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