Multiwaveband Phase Interferometer

B. R. Hill

doi:10.1117/12.962791

20 November 1989 Multiwaveband Phase Interferometer

B. R. Hill

Proceedings Volume 1163, Fringe Pattern Analysis; (1989) https://doi.org/10.1117/12.962791
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

The objectives and reasoning behind the specification of a new test instrument are analysed with brief reference to the instrument it was to replace. The theory, development and operation of a 150 mm diameter scanning multi-waveband phase interferometer is described. This entails a description of how the method of phase modulation evolved with reference to its linearity and ability to operate over a very wide range of wavelengths (.6 um - 10.6 um). The method of phase measurement and its resistance to vibration is described with a brief outline of the electronic building blocks required for the operation and calibration of the instrument. The requirements and choice of computer are discussed. It will then be shown how the above elements can be put together to form a very compact and versatile instrument. The functions of the associated software are also described both for data capture and display, which is real time, and also for analysis of the captured data. The analysis includes MTF, PSF, LSF, encircled energy, polynomial fitting, homogeneity measurement and the manipulation of stored interferograms. Results from the final instrument will also be presented.

Citation Download Citation

B. R. Hill "Multiwaveband Phase Interferometer", Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); https://doi.org/10.1117/12.962791

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KEYWORDS

Interferometers

Fringe analysis

Sensors

Beam splitters

Mirrors

Phase interferometry

Modulation transfer functions

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