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5 March 2021 Optical quantum network metrology
Thomas Gerrits
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Proceedings Volume 11700, Optical and Quantum Sensing and Precision Metrology; 117001E (2021) https://doi.org/10.1117/12.2586881
Event: SPIE OPTO, 2021, Online Only
Abstract
As quantum network technology is in the research and development phase, it is essential that robust quantum metrology protocols and procedures based on entanglement distribution be established. To enable that, it will be necessary to develop tools, metrics and measurement methods to characterize quantum network components, both individually, and in their interactions with classical and quantum networks. We present our efforts towards metrology of quantum networks and review a few metrology tools that are already available for quantum component characterization.
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Thomas Gerrits "Optical quantum network metrology", Proc. SPIE 11700, Optical and Quantum Sensing and Precision Metrology, 117001E (5 March 2021); https://doi.org/10.1117/12.2586881
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KEYWORDS
Metrology
Quantum networks
Quantum optics
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