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In this paper, the test level calibration and test method of the current clamp method are analyzed and validated. The analysis shows that the test based on the reference forward power obtained from the 50Ω calibration system is more severe than the one from the 150Ω calibration system on a same equipment under test (EUT). The net power under one impedance (50 or 150Ω) system can be calculated when the net power under another impedance (150 or 50 Ω) system was measured, whose net power conversion coefficient is equal to the theoretically calculated receiving circuit power difference under the corresponding test level. Moreover, the transmission loss of the calibration jig will be affected due to the 50Ω impedance mismatch of the current clamp input port, which will cause significant fluctuations in the net power with frequency changes.
Jinlong Li,Fujie Qiu, andShiping Ma
"Analysis of current clamp injection method in conducted immunity tests", Proc. SPIE 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications, 117633Q (12 March 2021); https://doi.org/10.1117/12.2586722
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Jinlong Li, Fujie Qiu, Shiping Ma, "Analysis of current clamp injection method in conducted immunity tests," Proc. SPIE 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications, 117633Q (12 March 2021); https://doi.org/10.1117/12.2586722