Failure analysis method for laser initiated device based on Michelson interference

Aifeng He; Bo Jing; Jianhua Chen; Dongxing Xia; Xiaoyu Zhao; Chunqiang Cao; Guoxing Zhang

doi:10.1117/12.2587253

12 March 2021 Failure analysis method for laser initiated device based on Michelson interference

Aifeng He, Bo Jing, Jianhua Chen, Dongxing Xia, Xiaoyu Zhao, Chunqiang Cao, Guoxing Zhang

Proceedings Volume 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications; 117635N (2021) https://doi.org/10.1117/12.2587253
Event: Seventh Symposium on Novel Photoelectronic Detection Technology and Application 2020, 2020, Kunming, China

Abstract

A new analysis method based on Michelson interference was given, which was tightly relied on the high reflection optical character in the laser initiated device (LID). By analysis of the optical interference wave combined with the microscopy image of the LID’ optical path, reasons for the failure under low temperature were focused on water frozen at the entering face of the LID lens, which was confirmed in the next insertion loss researches of LID under a fast transition from low temperature to normal environment. The failure analysis method based on Michelson interference was helpful for reaction classified analysis of the LID and useful to modification of the design. The failure analysis method based on Michelson interference was also one of the testable attractions of the LID.

Citation Download Citation

Aifeng He, Bo Jing, Jianhua Chen, Dongxing Xia, Xiaoyu Zhao, Chunqiang Cao, and Guoxing Zhang "Failure analysis method for laser initiated device based on Michelson interference", Proc. SPIE 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications, 117635N (12 March 2021); https://doi.org/10.1117/12.2587253

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