Presentation
3 October 2022 Multiscale characterization of nanostructure and dynamic processes in nanoporous composite materials using a correlative approach with ptychographic X-ray tomography and scanning small-angle X-ray scattering (Conference Presentation)
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Abstract
This works illustrates the capability of scanning Small-Angle X-ray Scattering (sSAXS) and Ptychographic X-ray nano Tomography (PXCT) to characterize nanoporous composite materials over multiple length scales on a fuel cell catalyst. Results comprise direct images of the nanostructure in a 30µm catalyst pillar at 20 nm resolution in combination with statistically averaged information of the nanostructure between 1-200nm from sSAXS with a spatial resolution of few tens of µm over macroscopic areas. The ex-situ material study is complemented by in-situ dynamic imaging of vapor condensation in 3D at 20nm spatial and temporal resolution of 10minutes.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christian Appel, Zirui Gao, Bastian J.M. Etzold, Marianne Liebi, and Manuel Guizar-Sicairos "Multiscale characterization of nanostructure and dynamic processes in nanoporous composite materials using a correlative approach with ptychographic X-ray tomography and scanning small-angle X-ray scattering (Conference Presentation)", Proc. SPIE 12242, Developments in X-Ray Tomography XIV, 122420B (3 October 2022); https://doi.org/10.1117/12.2633570
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KEYWORDS
X-rays

X-ray characterization

Composites

Scattering

Nanostructures

Tomography

Spatial resolution

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