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23 May 2022 Experimental study on the reliable working life of PUF chip for 8 years
Konggang Zhu, ChunSheng Guo, ShiWei Zhang, Hao Li
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Proceedings Volume 12254, International Conference on Electronic Information Technology (EIT 2022); 1225405 (2022) https://doi.org/10.1117/12.2639117
Event: International Conference on Electronic Information Technology (EIT 2022), 2022, Chengdu, China
Abstract
For the problem of reliability in the long-term use of integrated circuit chips, this article aims to work reliably for eight years, that is, after eight years of work, all devices can work normally, and a specific assessment plan for the life test is proposed. In this paper, a physical unclonable function chip is taken as an example, and related life-span experiments are carried out for the reliability target, and a method of life evaluation of a physical unclonable function chip is proposed. This method of evaluating life can also be used for other integrated circuit chips or components.
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Konggang Zhu, ChunSheng Guo, ShiWei Zhang, and Hao Li "Experimental study on the reliable working life of PUF chip for 8 years", Proc. SPIE 12254, International Conference on Electronic Information Technology (EIT 2022), 1225405 (23 May 2022); https://doi.org/10.1117/12.2639117
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KEYWORDS
Reliability
Integrated circuits
Oscillators
Electronic components
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