Front Matter: Volume 12457

doi:10.1117/12.2663703

31 October 2022 Front Matter: Volume 12457

Proceedings Volume 12457, Second International Conference on Testing Technology and Automation Engineering (TTAE 2022); 1245701 (2022) https://doi.org/10.1117/12.2663703
Event: Second International Conference on Testing Technology and Automation Engineering (TTAE 2022), 2022, Changchun, China

Abstract

This PDF file contains the front matter associated with SPIE Proceedings Volume 12457, including the Title Page, Copyright information, Table of Contents, and Conference Committee list.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Second International Conference on Testing Technology and Automation Engineering (TTAE 2022), edited by Yang Yue, Proc. of SPIE 12457, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510660199

ISBN: 9781510660205 (electronic)

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Publication of record for individual papers is online in the SPIE Digital Library.

Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

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▪ The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Conference Chair

P. C. Srinivasa Rao, Koneru Lakshmaiah University (China)

Publication Chair

Jude Hemanth, Karunya University (India)

Technical Program Committee Chair

Yang Yue, Xi’an Jiaotong University (China)

Technical Program Committee

Quanxin Zhu, Hunan University (China)
Alian Priou, Université Paris Nanterre (France)
Manuela-Roxanna Dijmarescu, Politehnica University of Bucharest (Romania)
Yajun Liu, South China University of Technology (China)
Yuliang Liu, Zhejiang Ocean University (China)
Fangfang Jian, Henan University of Science and Technology (China)
Sandip Kunar, Aditya Engineering College (India)
Sahil Verma, Lovely Professional University (India)
Ghous Bakhsh, NED University (Pakistan)
Ankit Sharma, Chitkara University (India)
Sivakumar Dhar Malingam, Universiti Teknikal Malaysia (Malaysia)
Yong Hao, East Chinajiaotong University (China)

Citation Download Citation

"Front Matter: Volume 12457", Proc. SPIE 12457, Second International Conference on Testing Technology and Automation Engineering (TTAE 2022), 1245701 (31 October 2022); https://doi.org/10.1117/12.2663703

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