Paper
16 December 2022 Bipedal region segmentation algorithm for infrared thermography based on relative temperature difference
Author Affiliations +
Proceedings Volume 12500, Fifth International Conference on Mechatronics and Computer Technology Engineering (MCTE 2022); 1250067 (2022) https://doi.org/10.1117/12.2660945
Event: 5th International Conference on Mechatronics and Computer Technology Engineering (MCTE 2022), 2022, Chongqing, China
Abstract
When infrared thermography is applied to the early diagnosis of diabetic foot, it is possible that there is a small temperature difference between the plantar region and the background region, which cannot segment the foot effectively. When the contrast between the plantar region and the background is good, the threshold method, edge-based method, and watershed method are easier to obtain good segmentation results. However, at the same time, when the room temperature and plantar temperature are relatively close, their image contrast is poor. In order to solve the segmentation problem in the case of poor contrast of medical images of diabetic foot, this study defines the relative temperature difference and proposes a method to achieve segmentation of bipedal regions in active infrared thermogram sequences based on the relative temperature difference. The experimental results show that this method can achieve high accuracy segmentation for heat maps with poor contrast.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhi Zeng, Junxia Zhu, and Zhenjie Cao "Bipedal region segmentation algorithm for infrared thermography based on relative temperature difference", Proc. SPIE 12500, Fifth International Conference on Mechatronics and Computer Technology Engineering (MCTE 2022), 1250067 (16 December 2022); https://doi.org/10.1117/12.2660945
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KEYWORDS
Image segmentation

Thermography

Infrared radiation

Image processing

Image processing algorithms and systems

Infrared imaging

Temperature metrology

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