Off-axis, slit based MTF measurements at PTB

M. Schake; H. Dierke; M. Schulz

doi:10.1117/12.3005522

20 September 2023 Off-axis, slit based MTF measurements at PTB

M. Schake, H. Dierke, M. Schulz

Proceedings Volume 12607, Optical Technology and Measurement for Industrial Applications Conference; 1260703 (2023) https://doi.org/10.1117/12.3005522
Event: Optics and Photonics International Congress, 2023, Yokohama, Japan

Abstract

This article presents off-axis modulation transfer function (MTF) measurements in the image field covered by the azimuthal angle θ = ±20 deg and a defocus range of Δz ∈ [−40 μm, +40 μm] with the slit based MTF measurement setup at PTB. The experimentally determined standard deviation of a set of N = 10 MTF repetition measurements under a certain set of repeatability conditions is employed to estimate the standard uncertainty uexp with respect to the repeatability of measurements in the setup. The importance of measurement repeatability and measurement reproducibility in the assessment of measurement accuracy and measurement uncertainty for interlaboratory comparisons is discussed.

Citation Download Citation

M. Schake, H. Dierke, and M. Schulz "Off-axis, slit based MTF measurements at PTB", Proc. SPIE 12607, Optical Technology and Measurement for Industrial Applications Conference, 1260703 (20 September 2023); https://doi.org/10.1117/12.3005522

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