The scintillation noise characteristics investigation and quantitative evaluation of low light level image intensifier

Xiangbiao Qiu; Xin Guo; Dan Liu; Haoyu Wu; Ni Zhang; Jian Wang; Gangcheng Jiao; Xiaoqing Cong; Ge Jin; Fangjian Qiao; Zhao Xu; Huijun Nie

doi:10.1117/12.2664348

4 April 2023 The scintillation noise characteristics investigation and quantitative evaluation of low light level image intensifier

Xiangbiao Qiu, Xin Guo, Dan Liu, Haoyu Wu, Ni Zhang, Jian Wang, Gangcheng Jiao, Xiaoqing Cong, Ge Jin, Fangjian Qiao, Zhao Xu, Huijun Nie

Author Affiliations +

Proceedings Volume 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications; 1261719 (2023) https://doi.org/10.1117/12.2664348
Event: 9th Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA 2022), 2022, Hefei, China

Abstract

This paper proposed a "high-speed imaging + digital processing" evaluation method to solve the problem of scintillation noise of low light image intensifiers under low illumination, which fills the gap in the quantitative evaluation of scintillation noise characteristics under low illumination in China. It was found that the scintillation noise is mainly characterized by scintillations with a diameter over 50μm and a duration of sub-microsecond or less. The frequency and the brightness of the scintillations are used to quantitatively evaluate scintillation noise. The effects of the input illuminance and luminous gain on the scintillation noise of the domestic low light image intensifier were investigated by the proposed method. With the increase of input illuminance, the frequency of scintillation noise increases linearly, and the brightness does not change obviously. As the luminous gain of the image intensifier increases, the frequency of scintillation noise increases linearly, but the rate of increase in scintillation frequency is higher than that of luminous gain increase. Based on the characteristics of scintillation noise, such as size, duration, intensity, and the variation law with various conditions, the scintillation noise of the image intensifier can be further studied. The quantitative evaluation method of scintillation noise based on scintillation noise frequency and average equivalent input electron quantity proposed in this paper is of great significance to the breakthrough of scintillation noise and the improvement of the performance of image tubes under low illumination in the future.

Citation Download Citation

Xiangbiao Qiu, Xin Guo, Dan Liu, Haoyu Wu, Ni Zhang, Jian Wang, Gangcheng Jiao, Xiaoqing Cong, Ge Jin, Fangjian Qiao, Zhao Xu, and Huijun Nie "The scintillation noise characteristics investigation and quantitative evaluation of low light level image intensifier", Proc. SPIE 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications, 1261719 (4 April 2023); https://doi.org/10.1117/12.2664348

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Scintillation

Image intensifiers

Microchannel plates

Interference (communication)

Image processing

High speed imaging

Ions

Show All Keywords

Keywords/Phrases

Search In:

Publication Years