Paper
4 April 2023 Sensitive elemental analysis of bismuth brass under minimal sample ablation with target-enhanced orthogonal double-pulse laser-induced breakdown spectroscopy
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Proceedings Volume 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications; 126173E (2023) https://doi.org/10.1117/12.2665979
Event: 9th Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA 2022), 2022, Hefei, China
Abstract
In order to realize sensitive elemental analysis of bismuth brass, especially under minimal sample ablation or high spatial resolution, target-enhanced orthogonal double-pulse laser-induced breakdown spectroscopy (TEODP-LIBS) in reheating scheme was studied. In the experiments, two electro-optically Q-switched Nd:YAG lasers were selected as the laser sources and their output beams were aligned orthogonally. The first laser was used to produce sample plasma and the second reheating laser was used to produce KHCO3 target plasma. The spectra were recorded with a compact spectrometer coupled with non-intensified CCD detectors. Bismuth brass samples were analyzed while 3 mJ and 30 mJ pulse energies were selected for the ablation and reheating laser pulse, respectively. Up to two-orders signal enhancement has been observed if compared TEODP-LIBS with LIBS without target-enhanced excitation. The calibration curves of bismuth and tin have been built in both TEODP-LIBS and LIBS analysis. 89 and 1002 ppm detection limit for bismuth and tin has been determined by TEODP-LIBS. And 6.5 and 3.8 enhancement factors have been achieved if compared with LIBS. Potential sensitive elemental analysis under high spatial resolution using TEODP-LIBS will be possible after optimizing the focusing condition.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yinhua Jiang, Yuqi Chen, and Runhua Li "Sensitive elemental analysis of bismuth brass under minimal sample ablation with target-enhanced orthogonal double-pulse laser-induced breakdown spectroscopy", Proc. SPIE 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications, 126173E (4 April 2023); https://doi.org/10.1117/12.2665979
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KEYWORDS
Bismuth

Laser induced breakdown spectroscopy

Pulsed laser operation

Laser ablation

Plasma

Tin

Statistical analysis

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