Research progress of laser spot center detection technology

Yi Li; Desheng Wang; Xinwei Wan; Weigang Li

doi:10.1117/12.2680585

31 May 2023 Research progress of laser spot center detection technology

Yi Li, Desheng Wang, Xinwei Wan, Weigang Li

Proceedings Volume 12704, Eighth International Symposium on Advances in Electrical, Electronics, and Computer Engineering (ISAEECE 2023); 127041S (2023) https://doi.org/10.1117/12.2680585
Event: 8th International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE 2023), 2023, Hangzhou, China

Abstract

Laser is one of the greatest inventions in modern times. With the development of laser and the updating of technology, the research on laser technology has made professional exploration in many aspects such as military application, remote sensing, industrial production, etc. However, in various applications of laser technology, the detection of laser spot image and the extraction of center position directly determine the reliability of the application. However, in the process of facula image acquisition, it will be affected by various factors such as background illumination, atmospheric disturbance, camera thermal noise, etc., which makes the facula unclear, image degradation, facula scattering, and facula local loss, which has a serious impact on facula detection and center extraction. Pointed out the difficulties in the field of spot center detection technology, combined with the actual situation in the application, sorted out the main solutions to the current problem of spot center detection technology, analyzed the advantages and disadvantages of the solutions, and provided some ideas and inspiration for relevant researchers.

Citation Download Citation

Yi Li, Desheng Wang, Xinwei Wan, and Weigang Li "Research progress of laser spot center detection technology", Proc. SPIE 12704, Eighth International Symposium on Advances in Electrical, Electronics, and Computer Engineering (ISAEECE 2023), 127041S (31 May 2023); https://doi.org/10.1117/12.2680585

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available