Design of IC aging prediction method based on logic gate type

Yifeng Meng

doi:10.1117/12.2686141

15 August 2023 Design of IC aging prediction method based on logic gate type

Yifeng Meng

Proceedings Volume 12719, Second International Conference on Electronic Information Technology (EIT 2023); 1271902 (2023) https://doi.org/10.1117/12.2686141
Event: Second International Conference on Electronic Information Technology (EIT 2023), 2023, Wuhan, China

Abstract

The aging of digital integrated circuits will have a certain [impact on the accuracy and reliability of circuits, and even pose a certain threat to the safety of circuits. To solve this problem, an IC aging prediction design method based on logic gate type is proposed. The aging characteristics of IC structure are identified by logic gate type technology, the aging degree index and evaluation algorithm of IC are standardized, and the aging prediction of IC is realized. Finally, experiments show that the IC aging prediction method based on logic gate type has high accuracy and reliability in practical application, and fully meets the research requirements.

Citation Download Citation

Yifeng Meng "Design of IC aging prediction method based on logic gate type", Proc. SPIE 12719, Second International Conference on Electronic Information Technology (EIT 2023), 1271902 (15 August 2023); https://doi.org/10.1117/12.2686141

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