Paper
15 August 2023 Advanced process library irradiation parameter modeling and analysis techniques
Fayin Shi, Liang Wang, Qianqian Sang, Mengdong Shen, Yong Li, Chang Liu
Author Affiliations +
Proceedings Volume 12719, Second International Conference on Electronic Information Technology (EIT 2023); 127193W (2023) https://doi.org/10.1117/12.2685474
Event: Second International Conference on Electronic Information Technology (EIT 2023), 2023, Wuhan, China
Abstract
The irradiation experimental analysis of chips can obtain irradiation data of advanced processes, which is beneficial to guide the research of new generation of anti-irradiation chips. In this paper, based on the GDS layout of the advanced process library, we firstly design the GDS layout hierarchy information extraction technology and implement the standard cell TCAD model automatic generation technology, then design the algorithm to generate irradiation parameters for heavy ion bombardment simulation experiments, and finally analyze the experimental data to establish the irradiation database. The experimental results show that it is feasible to establish an automatic irradiation data acquisition scheme based on the GDS layout of the advanced process library.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fayin Shi, Liang Wang, Qianqian Sang, Mengdong Shen, Yong Li, and Chang Liu "Advanced process library irradiation parameter modeling and analysis techniques", Proc. SPIE 12719, Second International Conference on Electronic Information Technology (EIT 2023), 127193W (15 August 2023); https://doi.org/10.1117/12.2685474
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KEYWORDS
TCAD

Ions

Modeling

Data modeling

Ion irradiation

Databases

Design and modelling

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