Time-resolved gain/loss studies under low- and high-power loading for the XeF C-A transition

Robert C. Sze; Marc L. Sentis; Matteo Vannini

doi:10.1117/12.20613

1 August 1990 Time-resolved gain/loss studies under low- and high-power loading for the XeF C-A transition

Robert C. Sze, Marc L. Sentis, Matteo Vannini

Proceedings Volume 1278, Excimer Lasers and Applications II; (1990) https://doi.org/10.1117/12.20613
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

The behavior of gain versus peak power deposition and the gain-length product versus total energ deposited are measured for devices with power deposition levels from 1 to 13 MW/cm under a variety of gas mixtures. The temporal correlation between the power deposition and gain shows that both the fluorescence and the gain occur after the power deposition has concluded for excitation pulses in the range of 10-30 ns. We find that both B-X and C-A fluorescence takes place in the afterglow and their temporal shapes are similar. This indicates that the C and B states are tightly coupled. This tight coupling has two detrimental consequences for C-state lasing. First is that the population of the B and C states are approximately equal rather than 90 % in the C state believed to exist for short pulse electron beam excitation. We believe this close coupling is due to the presence of electric fields in the afterglow which keep the electron temperature relatively hot. The relative populations of the B and C states are determined by a Boltzman distribution governed by the electron temperature and their relative energy separation. Second is that with the C state lifetime approximately the same as the B state lifetime the C-A saturation intensity is very high and efficient energy extraction is substantially more difficult.

Citation Download Citation

Robert C. Sze, Marc L. Sentis, and Matteo Vannini "Time-resolved gain/loss studies under low- and high-power loading for the XeF C-A transition", Proc. SPIE 1278, Excimer Lasers and Applications II, (1 August 1990); https://doi.org/10.1117/12.20613

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available