Integrated photonics offer a miniaturization potential for applications like sensing, data communication, as well as emerging quantum technologies. In this paper we show optical loss measurements for different e-beam approximation, data preparation, and exposure strategies concerning optical waveguides. The focus is on both, the decrease of e-beam writing time and the reduction of optical loss, which is achieved by applying Vistec’s shot count optimized and edge roughness aware JES Approximation, as compared to the common Border Approximation.
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