Paper
1 February 2024 An extreme random tree model combining EDA and PCA for predicting PV module temperature method
Author Affiliations +
Proceedings Volume 13068, Fifth International Conference on Optoelectronic Science and Materials (ICOSM 2023); 130681I (2024) https://doi.org/10.1117/12.3016364
Event: Fifth International Conference on Optoelectronic Science and Materials (ICOSM 2023), 2023, Hefei, China
Abstract
The variation in temperature of PV modules can affect the efficiency of power generation. Therefore, many studies have been conducted to predict the temperature of PV modules. In this paper, the extreme random tree algorithm is utilized with EDA and PCA analysis to accurately predict the temperature of PV modules in the next hour by filtering and structuring available features. EDA and PCA analysis enhance the model's understanding of the degree of addition, subtraction, and similarity between different features. They also help filter out and construct new key features. Compared to the random forest commonly used in previous studies, the extreme random tree algorithm is more random in the choice of bifurcation in tree building, enabling it to jump out of the vicious circle of local optima and learn the data adequately. After training, the model is tested using actual operating wind turbine data for validation, and the results indicate that the method is highly accurate, noise-resistant, targeted, and practical.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Li Peng, Li Liao, Gang Lai, Meiru Li, and Liang Zhang "An extreme random tree model combining EDA and PCA for predicting PV module temperature method", Proc. SPIE 13068, Fifth International Conference on Optoelectronic Science and Materials (ICOSM 2023), 130681I (1 February 2024); https://doi.org/10.1117/12.3016364
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Education and training

Data modeling

Principal component analysis

Electronic design automation

Solar cells

Machine learning

Cross validation

Back to Top