Structure-related anisotropic index of the optical thin films

Wei Zhang; Jian-Ying Fan; Y. Mu

doi:10.1117/12.22428

1 December 1990 Structure-related anisotropic index of the optical thin films

Wei Zhang, Jian-Ying Fan, Y. Mu

Proceedings Volume 1324, Modeling of Optical Thin Films II; (1990) https://doi.org/10.1117/12.22428
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The cylindrical model of optical thin films microstructure is assumed for the derivation of the equations expressing the structure-dependent anisotropic optical parameters in this paper. The equations are given for various values of cylinder obliquity and for several incident plane orientations. The equations are based on a capacitive model in which two index components are given and on the dielectric ellipsoid theory. They are applied to modeling ZnS thin films and the computed results have been given. We discuss the results, especially noting consistency of our model-based computations with measurements.

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Wei Zhang, Jian-Ying Fan, and Y. Mu "Structure-related anisotropic index of the optical thin films", Proc. SPIE 1324, Modeling of Optical Thin Films II, (1 December 1990); https://doi.org/10.1117/12.22428

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KEYWORDS

Thin films

Anisotropy

Zinc

Dielectrics

Refractive index

Data modeling

Model-based design

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