Focal length measurement using diffraction at a grating

Rajpal S. Sirohi; Harish Kumar; Narinder Kumar Jain

doi:10.1117/12.51050

1 January 1991 Focal length measurement using diffraction at a grating

Rajpal S. Sirohi, Harish Kumar, Narinder Kumar Jain

Proceedings Volume 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection; (1991) https://doi.org/10.1117/12.51050
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Diffraction at a low frequency grating is used for the measurement of focal length of a positive lens.

Citation Download Citation

Rajpal S. Sirohi, Harish Kumar, and Narinder Kumar Jain "Focal length measurement using diffraction at a grating", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); https://doi.org/10.1117/12.51050

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available