Noncontact technique for the measurement of linear displacement using chirped diffraction gratings

William B. Spillman Jr.; Peter L. Fuhr

doi:10.1117/12.51110

1 January 1991 Noncontact technique for the measurement of linear displacement using chirped diffraction gratings

William B. Spillman Jr., Peter L. Fuhr

Proceedings Volume 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection; (1991) https://doi.org/10.1117/12.51110
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

A noncontact method of monitoring structural displacement is demonstrated. The technique uses a lightweight diffraction grating with a variable period that is attached to the structure of interest. The position of the grating is monitored optically and linear displacement information can be separated from the effects of simultaneous rotary displacement. The technique is demonstrated for both static and dynamic measurements.

Citation Download Citation

William B. Spillman Jr. and Peter L. Fuhr "Noncontact technique for the measurement of linear displacement using chirped diffraction gratings", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); https://doi.org/10.1117/12.51110

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available