Comparative life test of 0.8-um laser diodes for SILEX under NRZ and QPPM modulation

Bodo Menke; Roland Loeffler

doi:10.1117/12.43763

1 June 1991 Comparative life test of 0.8-μm laser diodes for SILEX under NRZ and QPPM modulation

Bodo Menke, Roland Loeffler

Proceedings Volume 1417, Free-Space Laser Communication Technologies III; (1991) https://doi.org/10.1117/12.43763
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States

Abstract

The procedures and preliminary results of accelerated life tests performed within the framework of an evaluation program under the ESA contract are described. In order to calculate the activation energy and median lifetime and to investigate the drift behavior of optical parameters, a conventional three-temperature aging test at 30, 50, and 70 C is performed on 80 laser diodes in total, split into two subgroups operating under quaternary pulse position modulation (QPPM) and nonreturn-to-zero (NRZ) modulation at 16 Mbit/s with a PN-code length of (2 exp 7)-1. Measurements before and upon completion of the aging tests consist of P0/I curves, V/I characteristics, photo diode tracking ratios, spectra, mode hopping behaviors, far-field patterns, wave-front errors and astigmatisms, and linear polarization ratios.

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Bodo Menke and Roland Loeffler "Comparative life test of 0.8-μm laser diodes for SILEX under NRZ and QPPM modulation", Proc. SPIE 1417, Free-Space Laser Communication Technologies III, (1 June 1991); https://doi.org/10.1117/12.43763

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